{"id":15691,"date":"2026-09-01T15:10:22","date_gmt":"2026-09-01T13:10:22","guid":{"rendered":"https:\/\/stc.uniroma2.it\/?page_id=15691"},"modified":"2026-09-02T13:34:05","modified_gmt":"2026-09-02T11:34:05","slug":"fe-sem","status":"publish","type":"page","link":"https:\/\/stc.uniroma2.it\/?page_id=15691&lang=en","title":{"rendered":"FE-SEM"},"content":{"rendered":"\n<p><strong>TESCAN CLARA<\/strong><\/p>\n\n\n\n<p><strong>Ultra High-ResolutionScanning Electron Microscope<\/strong> (UHR SEM) \u2013 An ultra-high-resolution scanning electron microscope for the morphological characterization of materials and devices, achieving resolutions down to 0.9 nm at 15 kV and 1.6 nm at 1 kV. The instrument operates over an accelerating voltage range from 200 V to 30 kV, enabling high-resolution analysis even at low voltages. Its high depth of field and versatile imaging modes allow detailed observation of surfaces, thin films, nanostructures, and electron beam-sensitive materials, both conductive and non-conductive.<\/p>\n\n\n\n<p><strong>Microanalisi EDS<\/strong> <em>(Oxford AZtec Live Standard with Ultim Max 170 SDD detector)<\/em> \u2013 A system for the elemental analysis of materials using EDS spectroscopy, equipped with an SDD detector featuring an active area of 170 mm\u00b2 and an energy resolution of 127 eV. It enables qualitative and quantitative analyses, elemental mapping, and concentration profiling, integrating morphological and compositional information at the micro- and nanoscale.<\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full is-resized\"><a href=\"https:\/\/stc.uniroma2.it\/wp-content\/uploads\/2026\/09\/ph_fe-sem.jpg\" data-rel=\"lightbox-image-0\" data-rl_title=\"\" data-rl_caption=\"\" title=\"\"><img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"450\" src=\"https:\/\/stc.uniroma2.it\/wp-content\/uploads\/2026\/09\/ph_fe-sem.jpg\" alt=\"ph Fe-sem\" class=\"wp-image-15629\" style=\"width:400px\" srcset=\"https:\/\/stc.uniroma2.it\/wp-content\/uploads\/2026\/09\/ph_fe-sem.jpg 800w, https:\/\/stc.uniroma2.it\/wp-content\/uploads\/2026\/09\/ph_fe-sem-300x169.jpg 300w, https:\/\/stc.uniroma2.it\/wp-content\/uploads\/2026\/09\/ph_fe-sem-768x432.jpg 768w, https:\/\/stc.uniroma2.it\/wp-content\/uploads\/2026\/09\/ph_fe-sem-533x300.jpg 533w\" sizes=\"auto, (max-width: 800px) 100vw, 800px\" \/><\/a><\/figure>\n<\/div>","protected":false},"excerpt":{"rendered":"<p>TESCAN CLARA Ultra High-ResolutionScanning Electron Microscope (UHR SEM) \u2013 An ultra-high-resolution scanning electron microscope for the morphological characterization of materials and devices, achieving resolutions down to 0.9 nm at 15 kV and 1.6 nm at 1 kV. The instrument operates<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":15689,"menu_order":1,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_cbd_carousel_blocks":"[]","_uag_custom_page_level_css":"","_EventAllDay":false,"_EventTimezone":"","_EventStartDate":"","_EventEndDate":"","_EventStartDateUTC":"","_EventEndDateUTC":"","_EventShowMap":false,"_EventShowMapLink":false,"_EventURL":"","_EventCost":"","_EventCostDescription":"","_EventCurrencySymbol":"","_EventCurrencyCode":"","_EventCurrencyPosition":"","_EventDateTimeSeparator":"","_EventTimeRangeSeparator":"","_EventOrganizerID":[],"_EventVenueID":0,"_OrganizerEmail":"","_OrganizerPhone":"","_OrganizerWebsite":"","_VenueAddress":"","_VenueCity":"","_VenueCountry":"","_VenueProvince":"","_VenueZip":"","_VenuePhone":"","_VenueURL":"","_VenueStateProvince":"","_VenueLat":"","_VenueLng":"","footnotes":""},"class_list":["post-15691","page","type-page","status-publish","hentry"],"uagb_featured_image_src":{"full":false,"thumbnail":false,"medium":false,"medium_large":false,"large":false,"1536x1536":false,"2048x2048":false,"featured-blog-large":false,"featured-blog-small":false,"featured-service":false,"featured-recent-work":false},"uagb_author_info":{"display_name":"admin","author_link":"https:\/\/stc.uniroma2.it\/?author=1"},"uagb_comment_info":0,"uagb_excerpt":"TESCAN CLARA Ultra High-ResolutionScanning Electron Microscope (UHR SEM) \u2013 An ultra-high-resolution scanning electron microscope for the morphological characterization of materials and devices, achieving resolutions down to 0.9 nm at 15 kV and 1.6 nm at 1 kV. The instrument operates","_links":{"self":[{"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=\/wp\/v2\/pages\/15691","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=15691"}],"version-history":[{"count":2,"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=\/wp\/v2\/pages\/15691\/revisions"}],"predecessor-version":[{"id":15770,"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=\/wp\/v2\/pages\/15691\/revisions\/15770"}],"up":[{"embeddable":true,"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=\/wp\/v2\/pages\/15689"}],"wp:attachment":[{"href":"https:\/\/stc.uniroma2.it\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=15691"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}