AFM

Park Systems NX10

Designed to provide highly accurate quantitative measurements of surface topography, thanks to an orthogonal scanning system that separates movement along the XY and Z planes, significantly reducing the distortions and artifacts typically associated with conventional AFM configurations.

It operates in True Non-Contact™ mode, enabling the acquisition of ultra-high-resolution images without direct contact between the tip and the sample. The integration of a high-resolution coaxial optical microscope facilitates the identification of areas of interest and the performance of localized analyses at the micrometer and nanometer scales.